CONFERENCE TOPICS AND SPEAKERS


Both invited as well as contributed sessions are planned.


Invited sessions and organizers


• Aging in engineering and biological systems (M. Finkelstein),

• Repairable System Data Analysis (V. Krivtsov),

• Applications of reliability theory in science and engineering (I. Ushakov),

• Artificial intelligence in reliability engineering (G. Levitin),

• Reliability and Warranties (K.Suzuki),

• Computer intensive methods in statistical inference on System Reliability (A. Andronov, E. Chepurin),

• Computer tools for statistical analysis of data on reliability (B. Lemeshko),

• Copula applications in Reliability and Survival Analysis (Kolev N.),

• Reliability in Rail Transport Industry (P. Dersin),

• Statistical methods in biology and medicine ( C. Huber, F.Vonta),

• Reliability approach in carcinogenesis studies (H-D.I.Wu),

• Recent Advances in Lifetime Data Analysis (M.L. Lee),

• Reliability in nuclear industry (A. Antonov, M. Yastrebenetsky),

• Reliability in oil and gas industry (M. Sukharev),

• Reliability and related financial models (B. Dimitrov),

• Reliability Centered Maintenance, Risk Based Maintenance, Risk Based Inspection. (G.Zwingelstein),

• Probabilistic models for fatigue, wear and degradation (B. Kharlamov, I. Gertsbakh, Yu Paramonov),

• Reliability and quality control (V. Kashtanov),

• Reliability in aircraft industry (Yu. Paramonov),

• Reliability, safety, risks (V. Rykov, T. Bedford),

• Symmetries of a reliability system and their applications (F. Spizzichino),

• Statistical methods in reliability theory (V. Bagdonavichcius, M. Nikulin),

• Statistical service and consulting in reliability (L.Denis),

• Survivability and defense against external impacts (G. Levitin),

• Dependability and quality management,

• Empirical Byesian approach in reliability problems (I. Volodin),

• Fuzzy Information in Reliability Analysis (R. Viertl),

• Light traffic analysis of complex systems reliability (I. Kovalenko),

• Markov processes and reliability analysis of complex systems (V. Korolyuk, N. Limnios),

• Mathematical problems in reliability theory (V. Solev),

• Modeling of degradation and failure time data (A.Lehmann, W.Kahle),

• Multi-state and continuous-state system models in reliability (A. Lisnianski),

• Non-parametric problems in reliability (H. Lauter, H. Liero),

• Ordered and extremal statistics in reliability (V. Nevzorov),

• Order statistics (V.Nevzorov),

• Planning of accelerated trails (L. Gerville-Reache),

• Simulations and Computations in Reliability and Survival Analysis (V.Couallier),

• Statistical methods for quality control in reliability theory,

• Statistics for accelerated trails (W.Q. Meeker),

• Reliability approaches in the Quality of Life (M.Mesbah) ,

• Methods of Survival Analysis in Reliability and Life Longevity (Yu. Belyaev),

• Unbiased estimation in reliability theory (Ya. Lumelskii),

• Network Reliability and Survivability,

• Step-stress models and inference (U. Kamps),

• Runs and Scans with applications in quality control (M. Koutras),

• Distributions and Models with Applications in Reliability (N. Balakrishnan)

• Bayesian reliability modeling (R. Soyer)

• Special topics in reliability (R. Soyer)

• Kernel smoothing in reliability (Bo Henry Lindqvist)

• Intelligent data analysis in reliability theory (A. Bernstein)

Invited speakers

• V.Anisimov,
• T.Aven,
• T.Bedford,
• Yu.Belyaev,
• V.Bagdanavicius,
• N.Balakrishnan,
• P.Dersin,
• T.Duchesne,
• L.Escobar,
• M.Finkelstein,
• P. Deheuvels,
• U.Jensen,
• W.Meeker,

• C.Huber,
• W.Kahle,
• B.Kharlamov,
• V.Korolyuk,
• I.Kovalenko,
• V.Krivtsov,
• N.Limnios,
• B.Lindqvist,
• H.Liero,
• M.L.Lee,
• A.Lehmann,
• A.Lisnianski,
• M.LuValle,

• M.Mesbah,
• T.Duchesne,
• M.Nikulin,
• M.Newby,
• D. Silvestrov,
• N.Singpurvala,
• V.Solev,
• F.Spizzichino,
• K.Suzuki,
• I.Ushakov,
• R.Viertl,
• F.Vonta,
• Z.Ying


Additional events

• Plenary reports (invited speakers): up to 2-3 one-hour reports
• Review reports (invited speakers): duration 30-45 minutes
• Software Exhibition dedicated to reliability and risks
• Book Exhibition dedicated to reliability and risks
• Organizers of sessions (session is supposed to include 3-4 20-25 min. presentation) in the framework of given or additional section as well as participants in Exhibitions of software for Reliability and Risk analysis are welcome.